JPS52110684A - Measuring apparatus for refractive index distribution - Google Patents

Measuring apparatus for refractive index distribution

Info

Publication number
JPS52110684A
JPS52110684A JP2717676A JP2717676A JPS52110684A JP S52110684 A JPS52110684 A JP S52110684A JP 2717676 A JP2717676 A JP 2717676A JP 2717676 A JP2717676 A JP 2717676A JP S52110684 A JPS52110684 A JP S52110684A
Authority
JP
Japan
Prior art keywords
refractive index
measuring apparatus
index distribution
measuring points
interference fringe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2717676A
Other languages
English (en)
Japanese (ja)
Other versions
JPS577661B2 (en]
Inventor
Minoru Ito
Tetsuo Miya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP2717676A priority Critical patent/JPS52110684A/ja
Publication of JPS52110684A publication Critical patent/JPS52110684A/ja
Publication of JPS577661B2 publication Critical patent/JPS577661B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP2717676A 1976-03-15 1976-03-15 Measuring apparatus for refractive index distribution Granted JPS52110684A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2717676A JPS52110684A (en) 1976-03-15 1976-03-15 Measuring apparatus for refractive index distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2717676A JPS52110684A (en) 1976-03-15 1976-03-15 Measuring apparatus for refractive index distribution

Publications (2)

Publication Number Publication Date
JPS52110684A true JPS52110684A (en) 1977-09-16
JPS577661B2 JPS577661B2 (en]) 1982-02-12

Family

ID=12213747

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2717676A Granted JPS52110684A (en) 1976-03-15 1976-03-15 Measuring apparatus for refractive index distribution

Country Status (1)

Country Link
JP (1) JPS52110684A (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5239364A (en) * 1990-10-26 1993-08-24 Olympus Optical Co., Ltd. Light phase difference measuring method using an interferometer
JP2003082645A (ja) * 2001-09-13 2003-03-19 Nippon Solid Co Ltd 油溜め部を有する油水分離装置
CN110186654A (zh) * 2019-05-29 2019-08-30 深圳市慧视智图科技有限公司 一种纵向分辨率测试装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5239364A (en) * 1990-10-26 1993-08-24 Olympus Optical Co., Ltd. Light phase difference measuring method using an interferometer
JP2003082645A (ja) * 2001-09-13 2003-03-19 Nippon Solid Co Ltd 油溜め部を有する油水分離装置
CN110186654A (zh) * 2019-05-29 2019-08-30 深圳市慧视智图科技有限公司 一种纵向分辨率测试装置

Also Published As

Publication number Publication date
JPS577661B2 (en]) 1982-02-12

Similar Documents

Publication Publication Date Title
ATA285378A (de) Anordnung zum messen von entfernungen, insbesondere zum messen von pegelstaenden
JPS52110684A (en) Measuring apparatus for refractive index distribution
YU37400B (en) Measuring probe for wear measurements
JPS5237462A (en) Method of measuring shape of flat plates
JPS5288361A (en) Measuring method using interferometer
JPS5280859A (en) Measuring method using interferometer
JPS51124454A (en) Surface coarseness measuring method and equipment
JPS5288360A (en) Measuring method using interferometer
JPS5425786A (en) Repeated bending tester
JPS51139351A (en) Measure for taking measurement in the vertical direction
JPS5285837A (en) Measuring apparatus
JPS5273080A (en) Fluid refractive index measuring apparatus
JPS56163412A (en) Phase adjusting device of moire pattern
JPS522546A (en) Optical device to measure displacement of plane
JPS5294183A (en) Infrared temperature meter
JPS52114359A (en) Apparatus for measuring shape of thick steel plate
JPS51124973A (en) Temperature measurement apparatus
JPS5275482A (en) Fluid refractive index measuring apparatus
JPS5267681A (en) Fluid refractive index measuring apparatus
JPS5358267A (en) Indicator for distance measuring theodlite
JPS52141256A (en) Apparatus for measuring minute distance
FR2298096A1 (fr) Dispositif de mesure pour un four a coke
JPS535991A (en) Radio wave type angle measuring apparatus
JPS5240387A (en) Radiation temperature measuring device
JPS53126961A (en) Method and apparatus of measuring contour line moire fringes